Reliability Aware Circuit Optimization
نویسندگان
چکیده
منابع مشابه
Statistical lifetime reliability optimization considering joint effect of process variation and aging
Aging effect degrades circuit performance in the runtime, interacts with fabrication-induced device parameter variation, and thus posing significant impact on circuit lifetime reliability. In this work, a statistical circuit optimization flow is proposed to ensure lifetime reliability of the manufactured chip in the presence of process variation and aging effects. It exploits a variation-aware ...
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